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USA, CANADA

Xenocs Inc T. +1 413 587 4000 Contact: Scott Barton [email protected]

USA

Xenocs Inc – West Branch T. +1 805 455-9316 Contact : Matthew Williams [email protected]

MEXICO

Spectramex, S.A. de C.V. T. +52 55 5562 9289 Contact: Guillermo Picco [email protected]

BRAZIL

Instrutécnica T. +55 19 3289 9649 Contact: Hugo Vasconcellos [email protected]

SPAIN, PORTUGAL

Grupo Álava +34 696 18 74 78 Contact: Jesús de la Fuente [email protected]

JAPAN

Rigaku Corporation T. +81-42-545-8136 Contact: Kazuki Omoto [email protected]

AUSTRALIA, NEW ZEALAND

Crea Laboratory Technologies Pty Ltd. T. +61 2 4320 6670 Contact: Chris McCrea [email protected]

VIETNAM

2H Instrument Co.,Ltd – Hanoi Office T. (+84 24) 37911179 Contact: Dr. Hoang Tho Ha [email protected]

VIETNAM

2H Saigon Instrument Co.,Ltd – HCM Office T. (+84 28) 62515650 Contact: Mr. Truong Xuan Vuong [email protected]

GREECE

MALVA SA Analytical Equipment Supplies & Support T. +30210-8000904 Contact: Dimitris Stamelos [email protected]

TURKEY

Tekafos T. + 90 530 073 6490 Contact: Baran Pekeş [email protected]

INDIA

Icon Analytical Equipment Pvt. Ltd. T. +91 22 43 45 1600 Contact: Sanjeev Sharma [email protected]

INDIA

Xenocs T. + 91 892 930 2074 Contact: Ravindra Singh Sales Manager [email protected]

MIDDLE EAST

ProLab Systems T. +973 17180507 Contact: Zaid Al Mosheky [email protected]

Contact Xenocs Headquarters and Global Subsidiaries

Xenocs SAS

1-3 Allée du Nanomètre
38000 Grenoble
France

Fax: +33 4 76 26 95 49

Sales Department:
Phone: +33 4 76 26 95 40
[email protected]

Customer Support Department:
Phone: +33 4 76 26 95 47
[email protected]

Accounting Department:
Phone: +33 4 76 26 91 80
[email protected]

Human Resources Department:
Phone: +33 4 76 26 91 92
[email protected]

Xenocs subsidiaries

Xenocs Inc

4 Open Square Way, Suite 101
Holyoke, MA 01040, USA
Phone: +1 413 587 4000
[email protected]

Xenocs Inc – West Branch

351 Paseo Nuevo, Floor 2
Santa Barbara, CA 93101, USA

Xenocs Nordic ApS

Diplomvej 381
2800 Kgs. Lyngby, Denmark

Xenocs APAC

Xenocs Suzhou Scientific Instrument Co., Ltd.

Sino-Dutch (Suzhou) Science and Technology Innovation Port, Building D,
Podium Building Floor 3, No.588 Xiangrong Road, Xiangcheng District, Suzhou, Jiangsu, China, 215133

Contact Your Xenocs Local Representative

If your country is not listed below and you wish to contact us, please contact directly Xenocs SAS
[email protected]

AMERICAS

USA, CANADA

Xenocs Inc
4 Open Square Way, Suite 101 Holyoke, MA 01040, USA
T. +1 413 587 4000
Contact: Scott Barton
[email protected]

Xenocs Inc – West Branch
351 Paseo Nuevo, Floor 2 Santa Barbara, CA 93101, USA
T. +1 805 455-9316
Contact: Matthew Williams
[email protected]

MEXICO

Spectramex, S.A. de C.V.
Cto. Circunvalación Poniente No. 1 Desp. 302 Cd. Satélite, Naucalpan, Edo. de México., CP.53100 México.
T. +52 55 5562 9289
Contact: Guillermo Picco
[email protected]

BRAZIL

Instrutécnica
Caixa Postal 6668, Cep: 13084-970 Campinas SP, Av. Santa Izabel, 1.798A, Distr. Barão Geraldo, 13084-643 Campinas SP
T. +55 19 3289 9649
Contact: Hugo Vasconcellos
[email protected]

ASIA

CHINA

Xenocs Suzhou Scientific Instrument Co., Ltd.
Sino-Dutch (Suzhou) Science and Technology Innovation Port, Building D,
Podium Building Floor 3, No.588 Xiangrong Road, Xiangcheng District, Suzhou, Jiangsu, China, 215133
T. +86 400-159-0509
[email protected]
www.xenocs.cn

JAPAN

Rigaku Corporation
3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan
T. +81-42-545-8136
Contact: Kazuki Omoto, Product Manager (SAXS)
[email protected]
www.rigaku.com/ja

INDIA

Xenocs
T. +91 892 930 2074
Contact: Ravindra Singh Rawat
[email protected]

Icon Analytical Equipment Pvt. Ltd.
Icon House, 1st Floor, Plot No.52, Sector 6, Service Industrial Area, Sanpada, Navi Mumbai – 400 705, India
T. +91 22 43 45 1600
Mob. +91 931 3288 121
Contact: Sanjeev Sharma
[email protected]

SOUTH KOREA

Nano Lab Korea Co., Ltd
#131, U-Tower, 120, Heungdeokjungang-ro, Giheung-gu, Yongin-si Gyeonggi-do, 16950, Korea
T. +82 70 8822 1203
F. +82 31 212 1203
Contact: Hak-Jun Lee
[email protected]

VIETNAM

2H Instrument Co.,Ltd – Hanoi Office
No. 9, Lane 1/52 Pham Tuan Tai, Cau Giay, Hanoi
T. (+84 24) 37911179
F. (+84 24) 37911180
Contact : Dr. Hoang Tho Ha
Mob. (+84) 913227302
[email protected]
www.2hinst.com

2H Saigon Instrument Co.,Ltd – HCM Office
No. F-S16, Carillon building, 171A Hoang Hoa Tham, Ward 13, Tan Binh District, Ho Chi Minh City
T. (+84 28) 62515650
F. (+84 28) 62515651
Contact : Mr. Truong Xuan Vuong
Mob. (+84) 913229584
[email protected]
www.2hinst.com

EUROPE

FRANCE

Xenocs SAS
1-3 Allée du Nanomètre, 38000 Grenoble, France
T. +33 4 76 26 95 40
F. +33 4 76 26 95 49
[email protected]

DENMARK, FINLAND, NORWAY, SWEDEN, THE NETHERLANDS

Xenocs Nordic ApS
Diplomvej 381, 2800 Kgs. Lyngby, Denmark
T. +45 31250296
Contact: Søren Skou
[email protected]

GREECE

MALVA SA
Analytical Equipment Supplies & Support
13 Ilission Str, GR-14564 N. Kifissia, Greece
T. +30210-8000904
Contact: Dimitris Stamelos
[email protected]

POLAND

Xenocs SAS
1-3 Allée du Nanomètre, 38000 Grenoble, France
M. +48 577 443 771
Contact: Szymon Stolarek
[email protected]

CIS COUNTRIES

Technoinfo Ltd.
Contact: Oleg KORNEYCHIK
[email protected]
https://technoinfo.co.uk/

SPAIN, PORTUGAL

Grupo Álava
Desarrollo de Negocio, Área de Nanotechnología, Albasanz 16, 28037 Madrid, Spain
T. +34 91 56900
M. +34 696 18 74 78
Contact: Jesús de la Fuente
[email protected]

ROMANIA

Laborsistem SRL
Str. Crinul de Gradina nr.3, RO-032578 Bucharest 3, Romania
T. +40 31 8053 799
Contact: Sorin Buligescu
[email protected]

OCEANIA

AUSTRALIA, NEW ZEALAND

Crea Laboratory Technologies Pty Ltd.
Unit 4, 4 Teamster Close, P O BOX 3791, Tuggerah NSW 2259, Australia
T. +61 2 4320 6670
M.+61 410 692 579
Contact: Chris McCrea
[email protected]

MIDDLE EAST

THE UNITED ARAB EMIRATES, OMAN, QATAR, KUWAIT, SAUDI ARABIA, BAHRAIN, JORDAN, LEBANON

ProLab Systems
Kuwait Avenue, Al Mahooz, Block 334, Bldg:105, Flat 21
P.O. Box 65023, Manama, Bahrain
T. +973 17180507
Contact: Zaid Al Mosheky
[email protected]

TURKEY

Tekafos
Barbaros Mah. Susuz Sok. No: 13/1 Ataşehir / İstanbul, Türkiye
T. + 90 530 073 6490
Contact: Baran Pekeş
[email protected]

EGYPT

Advanced Instruments Technology
82 Al Amal Extension, Maadi 11431, Cairo, Egypt.
T. + 202 25203735
Contact : Ahmad Ramadan
[email protected]



Source	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Polychromatic Copper microfocus source for imaging a field of view of 14 mm x 14 mm. MetalJet D2+ 70 kV source (Ga). Motorized Dual or Triple source (Cu/Mo/Cr/Ga).
Optics	Patented 3D single reflection multilayer optics.
Detector	In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom): --Eiger2 R (500K, 1M or 4M) hybrid photon counting detectors Optional WAXS detectors for SWAXS: --Motorized 3-axis Eiger2 R 500K hybrid photon counting detector
Sample chamber	Large vacuum chamber. On-axis sample viewing (parallax free). Attachments for operation of sample in air. XL station: Dedicated air-space tailored for accommodating extra-large sample environments
Key features	Clean Beam technology: High flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position and automatic callibations. Virtual detector mode: Surfaces of detection > 200 mm x 200 mm.
Measurement capability	Nanoparticles size up to 250 nm, 500 nm or 900 nm in diameter depending on the Xeuss model. Nanoparticles size up to > 2.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS/WAXS measurements. Nanoparticles sizes down to 50 nm can be measured using the AuX source on spot sizes of 150 microns and with measuring times in the range of a minute or less. Scattering measurements up to 2Ɵ > 70° with Q-Xoom. Qmax > 49 nm-1 The X-ray imaging option extends the range of structural information from Å to mm while the Dark-field and Phase-contrast imaging (DF-PCI) option reveals nanostructure differences, interfaces and orientation.
Sample environment	Standard holders (multi-samples): solids, capillaries, powders and gels. Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer --- BioCube measuring cell with dynamic monitoring (compatible with pipetting robot) Temperature stages: --- Multi-purpose X-Ray temperature stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high-temperature sample stage (ambient to 1000°C) Mechanical stress stages: --- Tensile Stage (0 N to 600N). --- Couette stage for shear SAXS. --- Cryo-Shear Cell (-50°C to +450°C). Humidity stage (5% to 95% humidity at temperatures ranging from 10°C to 70°C). Temperature compatible advanced GISAXS stage with incidence angle control and additional rotation for texture or in-plane scattering analysis Other sample stages available under request
Software	Comprehensive Software Suite: Xplore: command and control software for intuitive data acquisition with automatic data reduction in absolute units and live data display providing also real-time equipment monitoring and scripting capabilities from any programming language. XSACT Pro (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation including unique modules for particle shape determination through direct modeling or AI-powered classification.
General parameters	Models & Footprint: Xeuss Pro C (1 m x 3.5 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: 4.8kW (single phase power)


Mirror type	Figure	Optic efficiency (calculated over mirror length for 70µm source)
Standard Montel mirrors		Eff = 42%
Xenocs FOX 3D mirrors		Eff = 62%


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 3D Cu 14-39 (♦)	0.19 x 0.19	5.4	Protein crystallography (♦) Powder diffraction
FOX 3D Cu 12-53	0.3 x 0.3	3	Protein crystallography (Long Unit Cells) Powder diffraction
FOX 3D Mo 10-31	0.13 x 0.13	4	Small molecule crystallography High pressure diffraction
FOX 3D Ag 10-30	0.13 x 0.13	3	Small molecule crystallography High pressure diffraction
FOX 3D Cr 8-30	0.20 x 0.20	6	Protein crystallography (S-SAD) Stress analysis
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Mo 25-25 (♦)	0.08 x 0.08	5	Small mollecule crystallography High pressure crystallography
FOX 2D Cu 25-25 (♦)	0.08 x 0.08	5.3	Protein crystallography (♦) Micro Diffraction, Reflectometry
FOX 3D Cu 21-21 HC (♦)	0.08 x 0.08	70 x 35	Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF
FOX 3D Cu 28-10	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF
FOX 3D Cr 30-8	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Cu 12-INF (♦)	1.2 x 1.2	1	Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦)
FOX 2D Mo 25-INF (♦)	0.85 x 1.3	0.5	Small angle x-ray scattering High resolution x-ray diffraction Surface scattering
FOX 2D 12-60 L (♦)	0.18 x 0.2	0.5 x 2	High resolution diffraction Small sample analysis
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cu High Flux *	< 190	6	> 400 x 10⁶	Protein crystallography Micro stress analysis Powder diffraction
GeniX 3D Mo High Flux	< 130	5	> 25 x 10⁶	Small Molecule crystallography High pressure
GeniX 3D Cr High Flux	< 190	6	> 300 x 10⁶	Stress Analysis
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film
GeniX 3D Cu Low Convergence *	< 250	3	> 120 x 10⁶	Small Angle X-ray Scattering Protein Crystallography


Model	Detailed specifications
Synchrotron scatterless slits (♦)	Please contact us for any technical information Discover what our customers say about it!
X-ray alignment camera (♦)	Please contact us for any technical information
Pin Diode detector (♦)	Please contact us for any technical information
Beam stop with integrated Pin Diode	Please contact us for any technical information


BioXolver configurations	BioXolver	BioXolver L
Utilisation	Research on biological macro-molecules in solution	Research on biological macro-molecules, including large complexes and interactions
X-ray source	Microfocus GeniX 3D, MetalJet, add-on to RAG	0.02-0.3nm
Optic	Aspheric single reflection multilayer optic
Collimation	Motorized scatterless point collimation	variable
Sample cell	Xenocs thermalized BioCube flow-cell with camera and pump
Sample handling	Pipetting robot with disposable tips
Sample capacity	Up to 2 x 96 well plates (thermalized)
Minimum sample volume	Down to 5 μL
Cleaning	Automated cleaning and drying with three cleaning fluids
Detector	Dectris in-vacuum hybrid pixel photon counting detector
Detector configuration	Fixed detector distance	Variable detector distance
Data reduction and analysis software	RAW and ATSAS
Q-range and typical protein size*	0.006 Å-1 / MW < 200 MDa / Rg < 135 Å	0.003 Å-1 / MW < 1.5 GDa / Rg < 270 Å
Overall length	3.2 m (2.7 m as add-on to existing source)	4.2 m
Options	UV-Vis, separate temperature control for sample trays and BioCube	UV-Vis, separate temperature control for sample trays and BioCube
Services	Installation, training, hot-line, maintenance contract	Installation, training, hot-line, maintenance contract



Source and optics	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Patented 2D single reflection multilayer optics.
Detector	Dectris Pilatus 3 hybrid photon counting detectors. Two fixed detectors for continuously and simultaneously. SAXS and WAXS acquisition up to 2θ=60°.
Beam Path	Windowless beam path entirely under vacuum from beam delivery system to detector sensor
Key features	Clean Beam technology: high flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Virtual detector mode: > 200° azimuth coverage with rotation of sample.
Measurement capability	Nanoparticles size up to 250 nm in diameter.
Sample environment	Standard holders: solids, capillaries, powders. Sample holders for powders and gels. Flow cells for liquids: --- Low noise flow cell --- Capillary flow cell Automatic Sample Changer Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-20°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 700°C) Tensile Stage (0-200N). GiSAXS stage compatible with high temperature sample stage. Custom stages on request.
Software	Acquisition software with automatic data reduction in absolute units and live data display. XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation.
General parameters	Fooprint: < 1x1 m². Weight: ~ 520 kg. Maximum power consumption: < 2000 W (single phase power). Self-contained: no external fluids required.
Warranty	Two years warranty and three years on X ray source.


Element of interest	Reference
O, F, Na, Mg, Al, Si, P, S	XAN-1
Nitrogen	XAN-2
Carbon	XAN-3
Boron	XAN-4
Mg, Al , Si	XAN-5
Be	XAN-6

Contact Xenocs

Inquire about our Solutions

Request a Quote

Customer & Technical Support

Find Your Nearest Xenocs Office or Distributor

Contact Xenocs: Local Representation

USA, CANADA

USA

MEXICO

BRAZIL

SPAIN, PORTUGAL

FRANCE

DENMARK, FINLAND, NORWAY, SWEDEN, THE NETHERLANDS

POLAND

ROMANIA

CIS COUNTRIES

EGYPT

CHINA

SOUTH KOREA

JAPAN

AUSTRALIA, NEW ZEALAND

VIETNAM

VIETNAM

GREECE

TURKEY

INDIA

INDIA

MIDDLE EAST

Contact Xenocs Headquarters and Global Subsidiaries

Xenocs SAS

Xenocs subsidiaries

Xenocs Inc

Xenocs Inc – West Branch

Xenocs Nordic ApS

Xenocs APAC

Xenocs Suzhou Scientific Instrument Co., Ltd.

Contact Your Xenocs Local Representative

AMERICAS

USA, CANADA

MEXICO

BRAZIL

ASIA

CHINA

JAPAN

INDIA

SOUTH KOREA

VIETNAM

EUROPE

FRANCE

DENMARK, FINLAND, NORWAY, SWEDEN, THE NETHERLANDS

GREECE

POLAND

CIS COUNTRIES

SPAIN, PORTUGAL

ROMANIA

OCEANIA

AUSTRALIA, NEW ZEALAND

MIDDLE EAST

THE UNITED ARAB EMIRATES, OMAN, QATAR, KUWAIT, SAUDI ARABIA, BAHRAIN, JORDAN, LEBANON

TURKEY

EGYPT

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X-ray Optics

Xenocs proposes a wide range of optics for both XRD and XRF applications.

2D-3D Beam shaping X-ray Optics

High Flux Optics

Small Spot Optics

Collimating Optics

1D Beam shaping X-ray Optics

High Flux Optics

Collimating Optics

X-ray beam delivery system

The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market.

High flux solutions

Small spot solutions

X-ray beam accessories

In addition to our high quality optical components and beam delivery systems, we propose accessories to optimize the performance of your setup.

Xeuss 3.0 specifications

Plenty of space for sample environment

With its large chamber and concept ensuring stationary sample during measurement, the Xeuss 3.0 is the perfect X-ray scattering platform instrument for now and the future.