7-12 July, 2024
Xenocs is pleased to attend the American Crystallographic Associationās 74th Annual Meeting from July 7-12 in Denver, Colorado, USA. Meet us at booth 511 in the exhibitor hall.
ACA 2024
Xenocs is pleased to attend the American Crystallographic Associationās 74th Annual Meeting from July 7-12 in Denver, Colorado, USA. Meet us at booth 511 in the exhibitor hall.
Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.
Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.
| Mirror type | Figure | Optic efficiency (calculated over mirror length for 70Āµm source) |
| Standard Montel mirrors |  | Eff = 42% |
| Xenocs FOX 3D mirrors |  | Eff = 62% |
Advanced materials research and characterization could require integration of specific or customized sample environments.
Xeuss 3.0 is perfectly adapted for such new projects thanks to its state of the art beamline concept.
It provides:
In particular, the following key features enable the user to optimize experiments or results:
SAXS acquisition continuously without any beamstop provides High Dynamic Range data.
No parasitic scattering from beamstop edges or detector window allows noise-free scattering at low q.
The direct beam is recorded simultaneously with the sample scattering profile during acquisition for accurate transmitted intensity measurement, used to obtain a precise absolute intensity normalization.
In addition, the direct beam profile thus measured is integrated in the data analysis (XSACT) to improve the accuracy of the results.
As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources.
Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.
In addition, Xenocs X-ray beam delivery systems coupled with motorized scatterless collimation achieve high resolution (low Īq beam), which is essential for studying large characteristic dimensions or for performing accurate mesophase analysis.
The high useful flux together with the high resolution capability are achieved through the combination of:
To ensure the best quality of X-ray scattering measurements, including on diluted or low contrast samples, Xeuss 3.0 combines high flux with low noise technology, which is the fruit of more than 10 years of development.
Key integrated features are:
For applications requiring very fast kinetics Xeuss 3.0 can also be delivered with a MetalJet source.
The Q-Xoom features full range computer-controlled detector travel to automatically adjust the sample-to-detector distance offering maximum flexibility of measurement for experiment optimization.
The virtual detector increases the measuring capabilities offering surfaces of collection larger than 200 mm2 x 200 mm2 at any sample-to-detector distance independently of detector size with automatic data reconstruction.
The large surface of detection is beneficial to optimize the azimuthal coverage in case of anisotropic samples or to benefit from high resolution measurement settings by characterizing smaller length scales (larger wave vectors) at longer sample to detector distance by a detector offset.
Advanced nanomaterials development and design require characterization over a large range of length scales. The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.
Automatic change of measuring settings include:
ā Q-Xoom change of measurement resolution through motorized translation of detector
ā Sequential SAXS /USAXS measurement with Bonse-Hart USAXS module
ā Change of energy radiation, up to 3 energies
ā Movable WAXS detector for out of equilibrium in situ SWAXS studies
The Nano-inXider features a smart dual detector design to detect atomic scale information and nanostructure simultaneously within one exposure. Long sample-to-detector distance for measuring large characteristic dimensions is achieved in SAXS through a vertical design with a small footprint.
Such configuration provides unique benefits:
With the Nano-inXider, the sample and the detectors are fixed. The optional WAXS detector extends the scattering range from the SAXS detector seamlessly throught 2Ę=60Ā°.
Such a unique vertical design provides unique benefits:
For anisotropic samples like fibers or oriented films, the Nano-inXider is equipped with a sample rotation stage that acquires the anisotropic scattering. The automatic acquisition involves the following steps:
The SAXS community relies on multiple algorithms with custom models and many different applications. XSACT offers a unified, versatile and complete data processing solution to get things done as fast as possible.
The low cost of ownership of the Nano-inXider mainly comes from its compactness and low cost of operation
The Nano-inXider acquires high signal to noise data by measuring the intense direct beam transmitted through the sample together with low intensity signal scattered from the sample.
Direct beam measurement, achieved with innovative beamstop-less data acquisition, enables automatic data treatment and display in absolute intensity with a very high accuracy.
Simultaneous low intensity signals detection is rendered possible by implementation of Clean Beam Technology.
The high dynamic range of intensity collection directly impacts data quality by:
ā Enabling the detection of low intensity scattered signal from weakly scattering samples
ā Accessing absolute quantity parameters such as particles number, molar mass, concentration, specific surface
ā Detecting large characteristic dimensions without need of user data treatment
The Nano-inXider integrates 15 years of R&D in the field of advanced components and instrument design to achieve an optimized balance of high X-ray flux on sample together with low parasitic scattering generated by the instrument.
Clean Beam Technology embeds the following key components and features:
The Nano-inXider measures SAXS without any beamstop and simultaneously collects the direct beam transmitted through the sample together with the scattered signal down to very low intensity levels.
Such high dynamic range data collection is rendered possible by innovative beamstop-less data acquisition.
The direct beam is recorded all along the acquisition, which leads to an accurate transmitted measurement used to obtain a precise absolute intensity normalization.
In addition, the measured direct beam profile (resolution function) is integrated in the data analysis to improve results quality.
Xenocs beamstop-less data acquisition integrates automatic qmin determination depending on the sample and benefits from no parasitic scattering from beamstop edges for high data quality at low q.
Automatic cosmic background removal reduces the impact of ambient parasitic scattering.
For the best understanding of output data, a scientist must have the tools to visualize, exchange and compare numerous graphical representations.
By combining data processing with advanced visualization capabilities, XSACT speeds up your workflow from acquisition to publication.
With the BioXolver you get:
Due to weak scattering from biological samples, high quality SAXS measurements require an instrument optimized for maximum X-ray intensity and lowest possible background noise. The BioXolver offers a unique combination of both capability in particular with:
The BioXolver can be installed with different source options.
It can integrate a MetalJet source to obtain the highest X-ray beam intensity possible in a laboratory instrument.
It can also be installed with the Genix3D, a bright microfocus low maintenance source with intensity levels only previously accessible with high power rotating anode sources. Such performance is achieved by combining the Genix3D long lasting source with new patented FOX 3D multilayer optics having a very high solid angle.
The BioXolver comes with windowless hybrid photon counting (HPC) detectors which allows for beamstopless measurements.
By operating without beamstop the direct beam is recorded all along the acquisition, which leads to an accurate transmission measurement used to obtain a precise absolute intensity normalization.
Moreover, operating without beamstop reduces the lowest scattering angle achievable as it is no more limited by beamstop size but is sample dependent.
The BioXolver uses state of the art collimation slits that greatly reduce noise and provide a clean beam.
High quality detection is achieved with hybrid photon counting (HPC) detectors integrated inside vacuum with no interfering window in front of detector sensor (windowless detector). This ensures that weakly scattering samples can also be measured at low concentrations.
Overall measuring background level of the instrument is further improved by proprietary automatic cosmic background removal algorithms suppressing high energy cosmics hitting the detector.
With the BioXolver standard well plates can be loaded & measured automatically using in-line pipetting robot & automated software suite for high user benefits.
The BioXolver includes powerful data reduction BioXTAS RAW widely used by the BioSAXS community.
It enables standard data operation and data analysis (Rg, molecular weight, etc.), together with advanced analysis using ATSAS plugins.
For high throughput analysis, the automated analysis function analyzes and compiles the results for you.
Sample size separation using size-exclusion chromatography in combination with the BioXolver can not only be used to ensure clean monodisperse samples, but also facilitates research on structurally heterogeneous & aggregation-prone multi-domain proteins as well as heterogeneous protein complexes in dynamic equilibria.
The BioXolver will work with any HPLC system, simply position the HPLC next to the instrument and hook up the column to the BioCUBE flow cell. The in-line UV/Vis ensures accurate determination of the sample concentration exactly at the SAXS exposure position. The included analysis software automatically reduces and provides an easy overview of your entire SEC-SAXS run and makes further analysis easy.
In situ UV measurement directly in the measurement cell provides concentration information of the sample before and after X-ray exposure or during a SEC-SAXS experiment.
This is especially important in this case as the sample is diluted in the transport path from the (HPLC) column exit to the x-ray exposure position.
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| Mirror type | Figure | Optic efficiency (calculated over mirror length for 70Āµm source) |
| Standard Montel mirrors | | Eff = 42% |
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High precision positioning of small sample volumes is ensured by the conjunction of an in-line pipetting robot and the BioCUBE, an advanced capillary flow cell, coupled to machine vision for sample monitoring.
Such low total consumption per sample condition or concentration is highly beneficial for biostructural research.
Tubeless handling of sample volume down to 5 Ī¼l. This is unique on the market.
Each sample is first automatically injected into the BioCUBE measurement cell with the tubeless pipetting robot, then positioned into the beam for measurement with dynamic real-time continuous control of its position.
The sample is maintained at the selected temperature both in the well plate during storage and in the BioCUBE during measurements.
Optionally, the BioCUBE may also be provided with integrated UV/Vis capabilities.
Using machine vision technology, the BioXolver is able to keep a digital eye on the sample at all times.
Once loaded, the sample is positioned with high precision in the X-ray beam while continuous feedback is provided to the automated control software to keep the volume in place.
Simple. Just put your sample in the chamber.
The instrument auto-aligns without any need of user interaction.
Data acquisition workflow is automatic and fast. X-ray scattering data is automatically normalized with no need of calibration by the user. This is achieved through a powerful software suite embedded in a fully motorized equipment using a unique fixed dual detector configuration.
Accurate scattering data instantly displayed by the instrument can be used on the fly for quick sample feedback, or for further assisted analysis using our XSACT software. A large choice of analysis functions is available and quick nanostructure parameters are provided through few clicks.
XSACT produces high quality publication-ready graphs and figures which can be easily exported to other documents through drag-and-drop or saved as files.
Learn more below about the Nano-inXider softwares which is central to obtain quick results on your sample.
The Nano-inXider provides fast answers and straightforward analysis.
It is easy to use. Its SMART design ensures a fast learning curve for both scattering experts, material scientists or technicians.
With full remote operation capability and auto alignment, the Nano-inXider reduces human errors to the minimum, and guarantees reproducibility as well as measurement traceability.
It is ideal for open access labs.
XSACT follows our SMART design for an easy workflow that guides you to results thanks to powerful graphical interactions.
