Journal of Alloys and Compounds, 2018, vol 763pp. 71-77
DOI:10.1016/j.jallcom.2018.05.197
Abstract
We report the fabrication and characterization of Ba3Zn2Fe24O41 (Zn2Z) hexaferrite films on silicon substrates using a simple sol-gel drop casting method. A combination of X-ray diffraction (XRD), scanning electron microscope (SEM), grazing incidence wide angle X-ray scattering (GIWAXS) and vibrating sample magnetometer (VSM) was used to characterize the structural and magnetic properties of the films. The XRD results confirmed the formation of the Z-type hexaferrite with some ZnFe2O4 and Ī±-Fe2O3 phases. SEM images showed several micron-size platelet-like hexagonal crystals with nanocrystals grown onto their surfaces. Interestingly, a few regions of the film exhibit self-assembly of the nanocrystals in ordered patterns. GIWAXS measurements indicated that the crystals are not randomly oriented within the film. The magnetic results revealed typical characteristics of a soft magnetic material consistent with the Z-type characteristics. The magnetization did not reach saturation up to the maximum applied field of 6āÆkOe. The saturation magnetization obtained with the field applied perpendicular to the film plane was found to be lower than that for a parallel geometry.
