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Xeuss Pro
The Ultimate Solution for Nanoscale Characterization
using SAXS/WAXS/GISAXS/USAXS/Imaging

Xeuss Pro

The Ultimate Solution

for Nanoscale Characterization using

SAXS/WAXS/GISAXS/USAXS/Imaging

Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Xeuss Pro: The Ultimate Solution for Nanoscale Characterization using SAXS/WAXS/GISAXS/USAXS/Imaging

The Xeuss Pro instrument for nanoscale characterization is the ultimate laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline, embodying over a decade of advanced research in Small-Angle X-ray Scattering technology. The Xeuss Pro integrates state-of-the-art advancements to set new standards in X-ray scattering instrumentation.
Designed to offer remarkable versatility and precision, this laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline brings atomic- to nano-scale characterization for scientific research to industrial applications alike, directly in your lab.
Key features that set the Xeuss Pro apart include:
  • Ultimate data quality: Achieve superior results with state-of-the-art optics, Clean Beam technology and high-resolution, low-noise detection capabilities.
  • Maximum modular versatility: Customize your setup with modular options to adapt to any experiment and effectively address your scientific questions.
  • Unlimited experimental possibilities: Experience unparalleled flexibility with our large sample chamber and a variety of sample holders and environments.
  • Comprehensive software suite: Enhance your research workflow with an all-encompassing software suite for seamless data acquisition, processing, and analysis.
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Ultimate data quality

The Xeuss Pro SAXS/WAXS/GISAXS/USAXS/Imaging instrument for nanoscale characterization stands at the forefront of scientific instrumentation, integrating a series of innovative features that not only enhance its performance but also broaden the scope of research possibilities, from pharmaceutical development to renewable energy materials and beyond.

Latest generation Optics

Latest generation Optics

The Xeuss Pro features state-of-the-art patented single reflection 3D multilayer optics. With an improved multilayer design and optimized geometry, these optics are engineered to significantly enhance flux, for high resolution measurements.

Clean Beam Technology

Clean Beam Technology

Drawing on more than two decades of experience in X-ray technologies and breakthrough innovations backed by several patents, Xeuss Pro combines high flux and high resolution with low noise technology through several advanced features:
  • High brightness, long-lasting microfocus sources that provide very high flux levels previously only possible with high power rotating anode sources.
  • Patented single reflection 3D multilayer optics with a very high solid angle of collection.
  • 4th generation motorized scatterless slits for precise collimation and high resolution.
  • Fully in-vacuum system from optics to detector sensor.
  • Hybrid pixel photon counting detector.
  • Proprietary automatic cosmic background reduction to reduce the impact of ambient parasitic scattering.
These innovations and features ensure that even the most advanced experiments, such as kinetic studies or shape analysis of diluted samples, and the most challenging samples —including those with low contrast, large characteristic dimensions, or requiring accurate mesophase analysis — can be studied in a laboratory setting. The Xeuss Pro guarantees superior X-ray scattering measurements, enabling precise and comprehensive scientific investigations across a wide range of research applications.
Clean Beam Technology for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline
Clean Beam Technology for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Beamstopless data acquisition

Beamstopless data acquisition

The Xeuss Pro laboratory SAXS/WAXS/GISAXS/USAXS beamline’s beamstopless data acquisition offers numerous advantages for detailed structural analysis and dynamic studies. It provides extended access to very low-q values, allowing for the study of larger structures and assemblies, and ensures continuous acquisition across the entire detector area, resulting in High Dynamic Range data. By eliminating the beamstop, artefacts such as shadowing effects and parasitic scattering from beamstop edges or detector window are avoided, leading to noise-free scattering at low-q values.

A significant benefit is the simultaneous recording of the direct beam with the sample scattering profile, enabling accurate measurement of transmitted intensity for precise absolute intensity normalization. The direct beam profile is integrated into the data analysis process in XSACT, improving result accuracy.

The beamstop-free design of the Xeuss Pro simplifies experimental alignment, increases efficiency, and supports diverse applications including time-resolved studies, in situ measurements, and high-throughput screening, making it a versatile choice for advanced SAXS research.

Q-Xoom with increased surface of detection

Q-Xoom with increased surface of detection

Q-Xoom features a fully automated, computer-controlled detector travel system that adjusts the sample-to-detector distance and performs the necessary callibations, providing maximum measurement flexibility for optimizing experimental resolution.
The virtual detector technology further enhances measurement capabilities by providing collection surfaces larger than 200 mm x 200 mm at any sample-to-detector distance independent of the physical detector size and with automatic data reconstruction from WAXS to SAXS. The large surface area detection provided by the Xeuss Pro is particularly advantageous for studying anisotropic samples and achieving high-resolution measurements of smaller length scales (larger wave vectors) at longer sample-to-detector distances.
Q-Xoom for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Maximum modular versatility

The Xeuss Pro instrument for nanoscale characterization using SAXS/WAXS/GISAXS/USAXS/Imaging is designed to accomodate numerous modular options that allow for customization to meet specific research needs for various scientific applications, ensuring versatility and ease of use. This advanced system addresses the critical need for characterizing nanomaterials over a vast range of length scales. It enables measurements across up to 5 orders of magnitude in q (wave vector) through entirely motorized configuration changes and full remote operation capabilities.

Modular options for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline
1
Multi-energy sources
2
Q-Xtend
3
USAXS
4
InXight
5
AuX source
6
Motorized SWAXS
7
Detectors

Multi-energy X-ray sources

Optimize your setup for any type of sample by selecting the appropriate radiation source to minimize absorption and fluorescence effects and adjust the source radiation match the size and shape of the structures being studied essential for studying specific characteristic dimensions.

The multi-source module of the Xeuss Pro instrument for nanoscale characterization features several key characteristics:

  • Supports up to 3 GeniX 3D (microfocus sources) (Cu, Mo, Cr) and is compatible with Ga MetalJet sources.
  • Motorized source switching in less than two minutes with fully automated alignment of the source, optics, and collimation.
  • With no manual handling required, the high precision switching enables remote sequential characterization of a sample using different radiations.

Whether you need copper radiation for standard soft matter, polymers, and nanomaterials characterization, molybdenum radiation for absorbing samples like charged polymer alloys with high Z elements or minerals, or chromium radiation to enhance resolution for low Z samples, the Xeuss Pro can provide these options ensuring precise and high-quality data.

Q-Xtend collimation module

Q-Xtend is an advanced collimation module for the Xeuss Pro, designed to analyze structural parameters of large dimensions (typically from 100 nm to 1 μm or more). It uses a motorized in/out crystal monochromator with the SAXS incident collimated beam, along with proprietary data acquisition and processing, to extend the range of data collected at low scattering angles and enhance the analysis of large particles and sample aggregation studies.

With the Q-Xtend collimation module for the Xeuss Pro, you can:

  • Measure larger particles than with standard high-resolution SAXS measurements.
  • Obtain more information from your SAXS curve, such as particle morphology or interactions, by accessing data close to the transmitted beam.
  • Measure micron-sized structures quickly, whether for standalone SAXS measurements, combined Bonse-Hart USAXS and SAXS measurements, or sample screening.

Motorized Bonse-Hart USAXS module

In addition to the motorized in/out crystal monochromator of the Q-Xtend, the Bonse-Hart Ultra-Small Angle X-ray Scattering (USAXS) module features a second motorized crystal channel cut analyzer. This extends the measuring capabilities of the Xeuss Pro to particle sizes up to 2.5 microns or larger together with nanoscale and atomic scale information.

The benefits of the Bonse-Hart USAXS module include:

  • USAXS and SAXS automatic sequential acquisitions on the same sample enabled by the in & out removable crystals.
  • High-quality SAXS and USAXS data merging.
  • No need for manual handling or instrument reconfiguration.
  • USAXS and SAXS/WAXS incident beams are colinear, eliminating the need to move the sample.
Motorized Bonse-Hart USAXS module for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

InXight Imaging module

The InXight X-ray imaging module significantly extends the length scale of analysis for the Xeuss Pro instrument for nanoscale characterization making it particularly suited for characterizing heterogeneous or processed samples. It offers an automatic switch between X-ray imaging and X-ray scattering measurements, enabling access to structural information from Å to mm.

Additionally, the Dark-Field and Phase-Contrast Imaging (DF-PCI) option modulates the X-ray beam to derive extra information on the samples through separate image components: attenuation (related to sample density), phase shifts (sensitive to interfaces), and dark-field (indicating the presence and orientation of nanostructures).

With the InXight X-ray imaging module for the Xeuss Pro, you can:

  • Rapidly collect X-ray images of heterogeneous samples and select regions of interest for SAXS/WAXS or USAXS measurements.
  • Gain a global understanding of complex samples or products by correlating local X-ray scattering and the microstructure.
  • Map the orientation of your sample structure when analyzing fibers or anisotropic samples.
InXight X-ray Imaging Module for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

AuX source: X-ray beam focusing channel

The AuX source is an additional X-ray source option for Xeuss Pro providing a monochromatic beam focused on the sample. With a photon density increase by one order of magnitude compared to the main SAXS/WAXS source, it is ideal for small-spot X-ray scattering applications. The AuX source is mounted on VersaXtage allowing a quick motorized change of source configuration.

The benefits and applications of the AuX source include:

  • Improved data quality or reduced acquisition time for GIWAXS experiments and mapping.
  • Capability to perform WAXS and SAXS experiments, measuring particle sizes down to 50 nm.
  • Access to time-resolved experiments with sub-minute time resolution.
InXight X-ray Imaging Module for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Motorized SWAXS for simultaneous SAXS and WAXS measurements

The motorized SWAXS detector is ideal for simultaneous collection of atomic- and nano-scale information during in-situ or out-of-equilibrium studies. Utilizing a dual detector scheme (main Q-Xoom detector for SAXS, 3-axis motorized WAXS detector) offers the ability to collect in-plane and out-of-plane scattering making the Xeuss Pro well-suited for SWAXS experiments on both isotropic and anisotropic samples.

The benefits of this additional motorized SWAXS detector include:

  • Precise mapping of scattering peak positions and intensities at very large scattering and azimuth angles.
  • Simultaneous data collection from both SAXS and WAXS detectors.
  • Collection of both in-plane and out-of-plane scattering information.
Motorized SWAXS for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Several detector options

Optimize your experiments by selecting the ideal detector tailored to your specific resolution and sensitivity requirements. The Xeuss Pro instrument for nanoscale characterization offers several in-vacuum motorized 3-axis detectors for 2D SAXS/WAXS, including the Eiger2 R (500K, 1M, or 4M) hybrid photon counting detectors. These detectors are compatible for day-to-day continuous operation in beamstop-free mode using GeniX 3D beam delivery systems, ensuring consistent performance throughout the instrument’s lifetime.

Additionally, proprietary automatic cosmic background reduction is available through the graphical user interface of Xeuss Pro control software, Xplore.

SAXS Detectors for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Unlimited experimental possibilities

Experience unparalleled flexibility with our large vacuum sample chamber, designed to accommodate a wide array of sample holders and environments. The fixed sample position allows seamless integration of new equipment, while the XL station supports even the largest third-party instruments, ensuring your research is never constrained by space.

Large sample chamber

Large sample chamber

With its large sample chamber and that maintains the sample stationary during experiments, the Xeuss Pro SAXS/WAXS/GISAXS/USAXS/Imaging instrument instrument stands as the ideal X-ray scattering platform instrument for both current and future applications. This setup minimizes constraints for integrating customized sample environments by eliminating the need to move the sample when adjusting resolution or measurement configuration.

Key features that set the Xeuss Pro apart include:

  • Large vacuum chamber with stationary sample during measurements.
  • Inline/on-axis sample visualization camera for an optimum visualization of the sample during any SAXS/WAXS/GISAXS/USAXS experiment.
  • Operation with the sample in air by incorporating incoming and outcoming vacuum flight path attachments to isolate the sample area.
  • Sample stage with long translations for sample mapping and batch measurements.
  • Broad range of standard sample environments with holder recognition.

XL station for large sample environments

XL station for large sample environments

The XL station is a dedicated air-space tailored for accommodating extra-large sample environments for operando SAXS experiments. It allows for smooth integration of external experiments into the Xeuss Pro beamline using the Xenocs carts.

BioCUBE & Robot for BioSAXS

BioCUBE & Robot for BioSAXS

This independent measuring station combines an in-line pipetting robot and the BioCUBE, an innovative capillary flow cell, for automated biostructural research with seamless integration.

With tubeless handling of sample volumes down to 5 μl, dynamic positioning, and automated temperature control, achieve accurate results while minimizing sample loss and contamination. This setup allows you to run automated multi-sample solution scattering measurements and data analysis efficiently.

Extensive selection of sample holders and environments

Extensive selection of sample holders and environments

To enhance the versatility and precision of SAXS measurements, enabling accurate characterization of materials under various conditions, the Xeuss Pro instrument for nanoscale characterization integrates a variety of sample holders and environments. These include holders for different sample types such as liquids, powders, and solids, as well as specialized environments for temperature control, humidity control, and tensile and shear testing. Moreover, the automatic sample recognition enables fully automatic instrument reconfiguration or very accurate estimation of sample position.

Numerous other options are offered, including additional customized solutions tailored to meet specific requirements.

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Comprehensive Software Suite

Xenocs Xplore control software

Intelligent control

The Xeuss Pro SAXS/WAXS/GISAXS/USAXS/Imaging instrument benefits from a new, improved command and control software, the Xenocs Xplore, with an ergonomic interface that enables effortless experiment planning and setup, effectively optimizing your research workflow.

Scriptable from any language

Xplore allows you to create your own experimental sequences using your preferred programming language, including Python, providing full control over all components of your Xeuss Pro system.

Complete actions traceability

Automatic and immediate traceability of all experimental commands is provided by Xplore, ensuring compliance of measurements with current regulations for experiment integrity.

Real-time equipment monitoring

With Xplore, you can monitor equipment performance and health in real-time, ensuring you can stay informed and responsive remotely at all times.

Xenocs Xplore Control and Command Software for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Xenocs XSACT Pro analysis software

The Xenocs XSACT Pro software transforms SAXS data analysis with its intuitive design and powerful capabilities. Featuring a wide range of algorithms, including unique modules for particle shape determination through model fitting or AI-powered classification, XSACT Pro provides comprehensive data processing and analysis accessible to beginners and experts alike.

Robust and comprehensive array of data analysis algorithms

XSACT Pro offers a comprehensive suite of analysis modules for characterizing size, structure, and related properties of various materials, providing a unified and versatile solution for data processing and analysis

Model fitting

Extract meaningful structural parameters of the sample being studied by comparing the observed data with simulated scattering patterns from both shapedependent (e.g., spheres, cylinders, ellipsoids) and shape-independent models. The modeling can also account for interparticle interactions, polydisperse systems, and mixtures.

AI-powered classification

Employ machine learning algorithms to classify and identify particle shapes based solely on their scattering profiles, without requiring prior knowledge.

Services

Onsite installation and commissioning

Ensuring your Xeuss Pro SAXS/WAXS/GISAXS/USAXS/Imaging instrument is seamlessly integrated into your laboratory environment is our top priority. Our onsite installation and commissioning services are tailored to meet your specific needs, guaranteeing optimal performance right from the start.

Operational training & scientific support

Our customized technical and scientific training programs equip your team with the skills and knowledge needed to confidently and proficiently operate the Xeuss Pro. Moreover, our team of scientific experts is available to offer guidance and support in optimizing experimental protocols, interpreting results, and exploring advanced SAXS applications in your research field.

Global support network

With a worldwide presence, we provide responsive support wherever your research takes you. Our regional service engineers provide direct assistance for software and hardware issues, ensuring a 24-hour response time. Our network of experts is committed to resolving operational challenges swiftly to minimize downtime and maximize productivity.

Partnership for success

With Xenocs, you are not just acquiring an advanced SAXS instrument; you are gaining a trusted partner dedicated to supporting your research endeavors every step of the way. Our comprehensive support services offer includes warranty programs, preventive maintenance, and annual service packages. We ensure your equipment operates at peak performance, so you can focus on achieving your scientific goals.

Service for Xeuss Pro The Ultimate Laboratory SAXS/WAXS/GISAXS/USAXS Beamline

Specifications